-
US-Iran truce shows cracks as war flares in Lebanon
-
In Romania, many Hungarians root for Orban in vote
-
Home where young Bowie dreamt of 'fame' to open to public
-
Crude rises, stocks fall on fears over nascent Iran ceasefire
-
Waiting for DeepSeek: new model to test China's AI ambitions
-
You're being watched: Japan battles online abuse of athletes
-
US court expedites Anthropic's legal battle with Department of War
-
Badminton to trial synthetic shuttlecocks because of feather shortage
-
Firm, fast Augusta set to test golf's best in 90th Masters
-
BTS to kick off world tour after landmark Seoul comeback
-
Grand National had to change to survive, says former winning jockey
-
Maple syrup or nutella? PM Carney calls Canadian Artemis astronaut
-
Comedy duo Flight of the Conchords reunion gigs sell out in minutes
-
US-Iran truce enters second day as war flares in Lebanon
-
Trump blasts NATO after closed-door Rutte meeting
-
Houston, we have a problem ... with the toilet
-
Slot admits Liverpool in 'survival mode' in PSG defeat
-
Trump makes up with Sahel juntas, with eye on US interests
-
Tiger Woods drug records to be subpoenaed by prosecutors
-
England's Rai wins Par-3 Contest to risk Masters curse
-
Brazil's Chief Raoni backs Lula in elections
-
Trump to discuss leaving NATO in meeting with Rutte
-
Atletico punish 10-man Barcelona, take control of Champions League tie
-
Dominant PSG leave Liverpool right up against it in Champions League tie
-
Meta releases first new AI model since shaking up team
-
Tehran residents relieved but divided by Trump truce
-
Vance says up to Iran if it wants truce to 'fall apart' over Lebanon
-
US, Iran truce hangs in balance as war flares in Lebanon
-
Scale of killing in Lebanon 'horrific': UN rights chief
-
'Ketamine Queen' jailed for 15 years over Matthew Perry drugs
-
Betis earn draw in Europa League quarter-final at Braga
-
Buttler hits form with IPL fifty as Gujarat win last-ball thriller
-
'Total victory' or TACO? Trump faces questions on Iran deal
-
Medvedev thrashed at Monte Carlo as Zverev battles through
-
Trump to discuss leaving NATO in meeting with Rutte: White House
-
Five US multiple major champions seek first Masters win
-
Howell got McIlroy ball as kid and now joins him at Masters
-
Turkey puts 11 on trial for LGBT 'obscenity'
-
Augusta boss eyes tradition and innovation balance at Masters
-
In Trump war on Iran, tactical wins and long-term damage to US
-
Argentine MPs to debate watered-down glaciers protection
-
Brazilian police dog sniffs out 48 tons of marijuana in record bust
-
Leicester close to third tier after points deduction appeal dismissed
-
In the heart of Beirut, buildings in flames and charred cars
-
Dilemma over crossings as fate of Hormuz ships remains uncertain
-
Laurance 'becomes someone else' to nab Tour of the Basque Country stage win
-
Mediators to 'fragile' US-Iran truce urge restraint as violations reported
-
Laurance pips Arrieta to Tour of the Basque Country third stage win
-
US, Iran ceasefire sees Israel's war goals left hanging
-
'Unfinished business': Opponents anxious, bitter after Iran ceasefire
Aehr Test Systems to Participate in the 11th Annual Oppenheimer Emerging Growth Conference on February 3, 2026
FREMONT, CA / ACCESS Newswire / January 27, 2026 / Aehr Test Systems (NASDAQ:AEHR), a leading provider of test and burn-in solutions for semiconductor devices used in artificial intelligence (AI), data center, automotive, and industrial applications, today announced it will participate in the Oppenheimer 11th Annual Emerging Growth Conference being held virtually February 3-4, 2026. Aehr Test CEO Gayn Erickson and CFO Chris Siuwill be hosting virtual meetings with investors throughout the day on Tuesday, February 3rd.
"We look forward to discussing with investors and shareholders Aehr's expanding role in enabling the next generation of semiconductor devices across a wide range of markets," said Mr. Erickson. "Aehr delivers complete turnkey solutions that improve the quality, reliability, and yield of semiconductors used in critical applications, including silicon carbide devices in electric vehicles and charging infrastructure, gallium nitride for advanced power conversion, and silicon photonics for data centers, 5G infrastructure and optical input/output (I/O). We are also seeing strong traction with AI processors in both wafer-level and packaged-part formats. The growing adoption of wafer-level and packaged-part test and burn-in across these markets is expected to be a significant growth driver for Aehr Test Systems."
For additional information or to schedule a virtual meeting with Aehr Test management, please contact your Oppenheimer representative, or Aehr's investor relations firm, PondelWilkinson, Inc., at [email protected].
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and packaged part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, advanced artificial intelligence (AI) processors, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr's products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full-wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full-wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for AI semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turnkey provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
# # #
Contacts:
Aehr Test Systems | PondelWilkinson, Inc. |
SOURCE: Aehr Test Systems
View the original press release on ACCESS Newswire
M.Robinson--AT