-
Judge orders Meta to pay $25 bn to New Mexico in Cambridge Analytica case
-
UN experts urge Meta to safeguard political expression in Brazil election
-
Champagne puts cork in project to expand production area
-
Websites go dark worldwide as AI exposes critical security flaws
-
Canadian publisher says novelist Orelien used AI to write novel
-
Defense in Maradona death trial seeks acquittal of doctor
-
Trump faces fresh questions over ties to 'humanitarian' Putin
-
Jansen, Rabada put South Africa in sight of win over Australia
-
Hansen back in Ireland squad for Nations Championship
-
Low Rhine weighed on German growth: central bank
-
Kremlin sees little 'substance' in Ukraine peace ideas
-
OpenAI says its AI agents disabled their own safety monitors
-
Top Arab-Israeli election candidate tells AFP Netanyahu win would be 'catastrophe'
-
Alldritt returns as France call up seven newcomers for Nations Championship
-
South African rugby player's death due to 'aortic dissection'
-
UN issues call to arms to combat off-the-charts El Nino
-
France's Macron lands in Riyadh on surprise 'solidarity' visit
-
Nigeria Ebola case matches DR Congo strain
-
Around the world, far right blames immigrants for French protests
-
Musk's SpaceX helps launch stock market gains
-
South Africa eases fuel pain as growth slows
-
Rose salutes Bournemouth's past heroes ahead of AC Milan clash
-
Woody Allen shoots new movie in Madrid
-
Argentina's Milei calls Spain PM Sanchez a 'dictator' in Madrid visit
-
Nvidia's Huang urges Europe to go all in on AI
-
Barca's Olmo injured for a month, misses Clasico
-
Five things to know as French bond yield tops 5%
-
Impacts of UK's new North Sea gas drilling
-
'Complete threat' Ngumoha excites Liverpool captain Van Dijk
-
Jansen takes five for South Africa as Australia forced to follow on
-
'The fishing's terrible': Deforestation devastates C.Africa river
-
Toulouse v Troyes Ligue 1 game postponed as France gripped by unrest
-
France's tourism sector worried about impact of riots
-
PSG winger Kvaratskhelia's season in doubt after torn ACL
-
Macron takes aim at Trump for using France riots for election gain
-
Putin, Witkoff meet in Russia for Ukraine war talks
-
North Korea says 'new firepower units' in place, loudspeakers to return
-
Musk's SpaceX helps fuel stock market gains
-
Indonesia leader hits out at market downgrade warning
-
Authors urge UK to halt 'draconian' Palestine Action ban as Rooney sales end
-
Macron slams 'stupid' comments based on AI videos by leaders on France riots
-
South Korea guides crowd-pulling shark out of canal
-
'Public health crisis': Indonesians seek fire relief from state
-
PSG's Kvaratskhelia season in doubt after torn ACL
-
British Museum sells second set of Bayeux exhibition tickets
-
President berates countries that 'insult' Indonesia over wildfires
-
Australian lawmaker loses both legs after 'targeted' attack
-
PSG's Kvaratskhelia set for months out with torn ACL
-
UK approves drilling in controversial Jackdaw gas field
-
Japan sends senior diplomat to Russia over detained journalist
Aehr Test Systems to Present at the 28th Annual Needham Growth Conference on January 13
FREMONT, CA / ACCESS Newswire / January 6, 2026 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in solutions, today announced that President and CEO Gayn Erickson and CFO Chris Siu will be presenting at the 28th Annual Needham Growth Conference in New York on Tuesday, January 13 at 1:30 pm ET (10:30 pm PT) and will be meeting with institutional investors throughout the day.
You may register to access a live or replay video webcast of the presentation via a link posted to the investor relations section of Aehr's website at www.aehr.com or by clicking here.
"We look forward to discussing with investors and shareholders Aehr's expanding role in enabling the next generation of semiconductor devices across a wide range of markets," said Mr. Erickson. "Aehr delivers complete turnkey solutions that improve the quality, reliability, and yield of semiconductors used in critical applications, including silicon carbide devices in electric vehicles and charging infrastructure, gallium nitride for advanced power conversion, and silicon photonics for data centers, 5G infrastructure and optical input/output (I/O). We are also seeing strong traction with AI processors in both wafer level and packaged part formats. The growing adoption of wafer level test and packaged part burn-in across these markets is expected to be a significant growth driver for Aehr Test Systems."
For additional information or to schedule a meeting with Aehr management, please contact your Needham representative or Aehr's investor relations firm, PondelWilkinson, Inc., at [email protected].
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and packaged part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, advanced artificial intelligence (AI) processors, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr's products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full-wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full-wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for AI semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turnkey provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
# # #
Contacts:
Aehr Test Systems | PondelWilkinson, Inc. |
SOURCE: Aehr Test Systems
View the original press release on ACCESS Newswire
Ch.Campbell--AT